JPS6262464B2 - - Google Patents
Info
- Publication number
- JPS6262464B2 JPS6262464B2 JP53146237A JP14623778A JPS6262464B2 JP S6262464 B2 JPS6262464 B2 JP S6262464B2 JP 53146237 A JP53146237 A JP 53146237A JP 14623778 A JP14623778 A JP 14623778A JP S6262464 B2 JPS6262464 B2 JP S6262464B2
- Authority
- JP
- Japan
- Prior art keywords
- etching
- insulating layer
- photoresist
- layer
- isolation insulating
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Element Separation (AREA)
- Local Oxidation Of Silicon (AREA)
- Drying Of Semiconductors (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14623778A JPS5572052A (en) | 1978-11-27 | 1978-11-27 | Preparation of semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14623778A JPS5572052A (en) | 1978-11-27 | 1978-11-27 | Preparation of semiconductor device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5572052A JPS5572052A (en) | 1980-05-30 |
JPS6262464B2 true JPS6262464B2 (en]) | 1987-12-26 |
Family
ID=15403195
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP14623778A Granted JPS5572052A (en) | 1978-11-27 | 1978-11-27 | Preparation of semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5572052A (en]) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS56160050A (en) * | 1980-05-14 | 1981-12-09 | Fujitsu Ltd | Semiconductor device and manufacture thereof |
JPS5896751A (ja) * | 1981-12-03 | 1983-06-08 | Seiko Epson Corp | 半導体装置 |
JPS58101066U (ja) * | 1981-12-29 | 1983-07-09 | 日産ディーゼル工業株式会社 | 機関冷却水通路のサ−モスタツト装置 |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5158071A (ja) * | 1974-11-18 | 1976-05-21 | Nichiden Varian Kk | Supatsutaetsuchinguho |
CA1090006A (en) * | 1976-12-27 | 1980-11-18 | Wolfgang M. Feist | Semiconductor structures and methods for manufacturing such structures |
-
1978
- 1978-11-27 JP JP14623778A patent/JPS5572052A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS5572052A (en) | 1980-05-30 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CA1159966A (en) | Process of forming recessed dielectric regions in a monocrystalline silicon substrate | |
JPH0548617B2 (en]) | ||
JPS58210634A (ja) | 半導体装置の製造方法 | |
JPH0917708A (ja) | 半導体装置のアラインメントキーパターンの形成方法 | |
JPH0648707B2 (ja) | 半導体構造及びその製造方法 | |
US5437763A (en) | Method for formation of contact vias in integrated circuits | |
US4389294A (en) | Method for avoiding residue on a vertical walled mesa | |
JPS631753B2 (en]) | ||
US4775644A (en) | Zero bird-beak oxide isolation scheme for integrated circuits | |
JPS6262464B2 (en]) | ||
JPH05849B2 (en]) | ||
KR100225955B1 (ko) | 반도체 소자의 소자분리막 형성방법 | |
JPS6029219B2 (ja) | 半導体集積回路の製造方法 | |
JPH0396249A (ja) | 半導体装置の製造方法 | |
KR100286901B1 (ko) | 반도체 소자 분리를 위한 얕은 트렌치 제조 방법 | |
KR100204418B1 (ko) | 반도체 소자 분리방법 | |
JPH0119255B2 (en]) | ||
EP0146613A1 (en) | PROCESS FOR MANUFACTURING SEMICONDUCTOR STRUCTURES. | |
JPH0258778B2 (en]) | ||
KR100416813B1 (ko) | 반도체소자의필드산화막형성방법 | |
JPH0481329B2 (en]) | ||
JPS5950540A (ja) | 半導体装置の製造方法 | |
JPH0152900B2 (en]) | ||
JPS595668A (ja) | 半導体装置の製造方法 | |
JPS58170012A (ja) | 半導体装置の製造方法 |